Microelectronic test pattern NBS-4
Title:
Microelectronic test pattern NBS-4
Author:
Thurber, W. Robert.
Personal Author:
Publication Information:
Washington : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1978.
Physical Description:
vi, 83 pages 26 cm.
General Note:
"This activity was supported by the Defense Advanced Research Projects Agency and the National Bureau of Standards."
Language:
English
Subject Term:
Added Author:
Format :
Book