Cover image for ARPA/NBS workshop III : test patterns for integrated circuits
Title:
ARPA/NBS workshop III : test patterns for integrated circuits
Author:
Schafft, Harry A.
Personal Author:
Publication Information:
Washington : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976.
Physical Description:
v, 46 pages : illustrations ; 26 cm.
General Note:
Consists of synopses of talks and discussions presented at the workshop held Sept. 6, 1974 in Scottsdale, Ariz.
Language:
English
Format :
Book

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QC100 .U57 NO.400-15 Adult Non-Fiction Central Closed Stacks-Non circulating
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