Scanning electron microsope examination of wire bonds from high-reliability devices
Title:
Scanning electron microsope examination of wire bonds from high-reliability devices
Author:
Leedy, Kathryn O.
Personal Author:
Publication Information:
[Washington] : U.S. National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1973.
Physical Description:
vi, 28 pages : illustrations ; 26 cm.
Language:
English
Format :
Book