Cover image for Carrier lifetime measurement by the photoconductive decay method
Title:
Carrier lifetime measurement by the photoconductive decay method
Author:
Mattis, Richard L.
Personal Author:
Publication Information:
Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1972.
Physical Description:
ix, 40 pages : illustrations ; 26 cm.
General Note:
"Issued September 1972."

"A United States Department of Commerce publication."--Cover.

"Carried out as part of the Joint Program on Methods of Measurement for Semiconductor Materials, Process Control, and Devices."

Sponsored by the National Bureau of Standards and others.
Language:
English
Added Author:
Format :
Book

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QC100 .U577 NOS. 736-743 V.736 Adult Non-Fiction Central Closed Stacks-Non circulating
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