Carrier lifetime measurement by the photoconductive decay method
Title:
Carrier lifetime measurement by the photoconductive decay method
Author:
Mattis, Richard L.
Personal Author:
Publication Information:
Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1972.
Physical Description:
ix, 40 pages : illustrations ; 26 cm.
General Note:
"Issued September 1972."
"A United States Department of Commerce publication."--Cover.
"Carried out as part of the Joint Program on Methods of Measurement for Semiconductor Materials, Process Control, and Devices."
Sponsored by the National Bureau of Standards and others.
Language:
English
Added Author:
Added Corporate Author:
Format :
Book