Cover image for Methods of measurement for semiconductor materials, process control, and devices.
Methods of measurement for semiconductor materials, process control, and devices.
Title:
Methods of measurement for semiconductor materials, process control, and devices.
Author:
Bullis, W. Murray, 1930-
Personal Author:
Bullis, W. Murray, 1930-
Publication Information:
Washington : GPO, 1970.
Physical Description:
vi, 52 pages : illustrations.
Series:
United States. National Bureau of Standards. Technical note ; 560

NBS technical note ; 560.
Language:
English
Added Author:
Baroody, A. J., Jr.
Format :
Book

Desktop View