A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films
Title:
A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films
Author:
McCrackin, Frank L.
Personal Author:
Publication Information:
Washington : Dept. of Commerce, National Bureau of Standards : U.S. G.P.O., 1964.
Physical Description:
ii, 42 pages : charts ; 26 cm.
Language:
English
Added Author:
Format :
Book