Cover image for Correction factor tables for four-point probe resistivity measurements on thin, circular semiconductor samples
Title:
Correction factor tables for four-point probe resistivity measurements on thin, circular semiconductor samples
Author:
United States. National Bureau of Standards.
Publication Information:
Washington : U.S. Govt. Print. Off., 1964.
Physical Description:
34 pages : tables.
Language:
English
Format :
Book

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QC100 .U577 NOS. 198-206-3 V.199 Adult Non-Fiction Central Closed Stacks-Non circulating
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