Correction factor tables for four-point probe resistivity measurements on thin, circular semiconductor samples
Title:
Correction factor tables for four-point probe resistivity measurements on thin, circular semiconductor samples
Author:
United States. National Bureau of Standards.
Corporate Author:
Publication Information:
Washington : U.S. Govt. Print. Off., 1964.
Physical Description:
34 pages : tables.
Language:
English
Added Author:
Format :
Book