Cover image for A two-parameter scintillation spectrometer system for measurement of secondary proton, deuteron, and triton distributions from materials under 558-MeV-proton irradiation
A two-parameter scintillation spectrometer system for measurement of secondary proton, deuteron, and triton distributions from materials under 558-MeV-proton irradiation
Title:
A two-parameter scintillation spectrometer system for measurement of secondary proton, deuteron, and triton distributions from materials under 558-MeV-proton irradiation
Author:
Beck, Sherwin M.
Personal Author:
Publication Information:
Washington, D.C. : National Aeronautics and Space Administration ; [Springfield, Va.] : [For sale by the National Technical Information Service], 1975.
Physical Description:
iii, 60 pages : illustrations ; 27 cm.
General Note:
Cover title.

Prepared at Langley Research Center.
Language:
English
Added Corporate Author:
Format :
Book