Cover image for Effects of nuclear radiation on a high-reliability silicon power diode
Title:
Effects of nuclear radiation on a high-reliability silicon power diode
Author:
Been, Julian F.
Personal Author:
Physical Description:
volumes : illustrations ; 27 cm.
General Note:
Cover title.

Prepared at Lewis Research Center.

Part 2 also by Ira T. Myers and Michael P. Godlewski.
Language:
English
Contents:
1. Change in 1-5 design characteristics -- 2. Analysis of forward electrical characteristics -- 3. Junction capacitance -- 4. Analysis of reverse bias characteristics --
Added Corporate Author:
Format :
Book

Available:*

Library
Call Number
Material Type
Home Location
Status
Central Library TL507 .U565 D7421-7429 D7423 V.4 Adult Non-Fiction Central Closed Stacks-Non circulating
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Central Library TL507 .U565 D6321-6330 D6330 V.3 Adult Non-Fiction Central Closed Stacks-Non circulating
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